High-mobility, sputtered films of indium oxide doped with molybdenum
Identifieur interne : 00A676 ( Main/Repository ); précédent : 00A675; suivant : 00A677High-mobility, sputtered films of indium oxide doped with molybdenum
Auteurs : RBID : Pascal:04-0132808Descripteurs français
- Pascal (Inist)
- Wicri :
- concept : Molybdène.
English descriptors
- KwdEn :
Abstract
Thin films of molybdenum-doped indium oxide, an n-type transparent conducting oxide, were deposited on glass substrates by a large-area deposition technique, radio-frequency magnetron sputtering, and their electrical properties were examined. Molybdenum content was varied from 1 to 4 wt%, and the highest mobility achieved was 83 cm2V-1s-1 at a carrier concentration of 3.0×1020 cm-3 without any postdeposition treatment for one of the films made from the target with 2 wt% Mo. Temperature-dependent Hall analysis indicated that this high mobility is limited by phonon scattering, whereas the method of four coefficients analysis showed that the conduction band is parabolic. © 2004 American Institute of Physics.
Links toward previous steps (curation, corpus...)
- to stream Main, to step Corpus: 00BC99
Links to Exploration step
Pascal:04-0132808Le document en format XML
<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en" level="a">High-mobility, sputtered films of indium oxide doped with molybdenum</title>
<author><name sortKey="Yoshida, Yuki" uniqKey="Yoshida Y">Yuki Yoshida</name>
<affiliation wicri:level="2"><inist:fA14 i1="01"><s1>Department of Physics, Colorado School of Mines, Golden, Colorado 80401</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">États-Unis</country>
<placeName><region type="state">Colorado</region>
</placeName>
<wicri:cityArea>Department of Physics, Colorado School of Mines, Golden</wicri:cityArea>
</affiliation>
</author>
<author><name sortKey="Wood, David M" uniqKey="Wood D">David M. Wood</name>
<affiliation wicri:level="2"><inist:fA14 i1="01"><s1>Department of Physics, Colorado School of Mines, Golden, Colorado 80401</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">États-Unis</country>
<placeName><region type="state">Colorado</region>
</placeName>
<wicri:cityArea>Department of Physics, Colorado School of Mines, Golden</wicri:cityArea>
</affiliation>
</author>
<author><name sortKey="Gessert, Timothy A" uniqKey="Gessert T">Timothy A. Gessert</name>
<affiliation wicri:level="2"><inist:fA14 i1="02"><s1>National Renewable Energy Laboratory, Golden, Colorado 80401</s1>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">États-Unis</country>
<placeName><region type="state">Colorado</region>
</placeName>
<wicri:cityArea>National Renewable Energy Laboratory, Golden</wicri:cityArea>
</affiliation>
</author>
<author><name sortKey="Coutts, Timothy J" uniqKey="Coutts T">Timothy J. Coutts</name>
<affiliation wicri:level="2"><inist:fA14 i1="02"><s1>National Renewable Energy Laboratory, Golden, Colorado 80401</s1>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
</inist:fA14>
<country xml:lang="fr">États-Unis</country>
<placeName><region type="state">Colorado</region>
</placeName>
<wicri:cityArea>National Renewable Energy Laboratory, Golden</wicri:cityArea>
</affiliation>
</author>
</titleStmt>
<publicationStmt><idno type="inist">04-0132808</idno>
<date when="2004-03-22">2004-03-22</date>
<idno type="stanalyst">PASCAL 04-0132808 AIP</idno>
<idno type="RBID">Pascal:04-0132808</idno>
<idno type="wicri:Area/Main/Corpus">00BC99</idno>
<idno type="wicri:Area/Main/Repository">00A676</idno>
</publicationStmt>
<seriesStmt><idno type="ISSN">0003-6951</idno>
<title level="j" type="abbreviated">Appl. phys. lett.</title>
<title level="j" type="main">Applied physics letters</title>
</seriesStmt>
</fileDesc>
<profileDesc><textClass><keywords scheme="KwdEn" xml:lang="en"><term>Carrier relaxation time</term>
<term>Experimental study</term>
<term>Hall mobility</term>
<term>Indium compounds</term>
<term>Molybdenum</term>
<term>Semiconductor thin films</term>
<term>Sputter deposition</term>
</keywords>
<keywords scheme="Pascal" xml:lang="fr"><term>6855A</term>
<term>7350G</term>
<term>7361L</term>
<term>7350J</term>
<term>8115C</term>
<term>8105H</term>
<term>Etude expérimentale</term>
<term>Indium composé</term>
<term>Dépôt pulvérisation</term>
<term>Mobilité Hall</term>
<term>Temps relaxation porteur charge</term>
<term>Couche mince semiconductrice</term>
<term>Molybdène</term>
</keywords>
<keywords scheme="Wicri" type="concept" xml:lang="fr"><term>Molybdène</term>
</keywords>
</textClass>
</profileDesc>
</teiHeader>
<front><div type="abstract" xml:lang="en">Thin films of molybdenum-doped indium oxide, an n-type transparent conducting oxide, were deposited on glass substrates by a large-area deposition technique, radio-frequency magnetron sputtering, and their electrical properties were examined. Molybdenum content was varied from 1 to 4 wt%, and the highest mobility achieved was 83 cm<sup>2</sup>
V<sup>-1</sup>
s<sup>-1</sup>
at a carrier concentration of 3.0×10<sup>20</sup>
cm<sup>-3</sup>
without any postdeposition treatment for one of the films made from the target with 2 wt% Mo. Temperature-dependent Hall analysis indicated that this high mobility is limited by phonon scattering, whereas the method of four coefficients analysis showed that the conduction band is parabolic. © 2004 American Institute of Physics.</div>
</front>
</TEI>
<inist><standard h6="B"><pA><fA01 i1="01" i2="1"><s0>0003-6951</s0>
</fA01>
<fA02 i1="01"><s0>APPLAB</s0>
</fA02>
<fA03 i2="1"><s0>Appl. phys. lett.</s0>
</fA03>
<fA05><s2>84</s2>
</fA05>
<fA06><s2>12</s2>
</fA06>
<fA08 i1="01" i2="1" l="ENG"><s1>High-mobility, sputtered films of indium oxide doped with molybdenum</s1>
</fA08>
<fA11 i1="01" i2="1"><s1>YOSHIDA (Yuki)</s1>
</fA11>
<fA11 i1="02" i2="1"><s1>WOOD (David M.)</s1>
</fA11>
<fA11 i1="03" i2="1"><s1>GESSERT (Timothy A.)</s1>
</fA11>
<fA11 i1="04" i2="1"><s1>COUTTS (Timothy J.)</s1>
</fA11>
<fA14 i1="01"><s1>Department of Physics, Colorado School of Mines, Golden, Colorado 80401</s1>
<sZ>1 aut.</sZ>
<sZ>2 aut.</sZ>
</fA14>
<fA14 i1="02"><s1>National Renewable Energy Laboratory, Golden, Colorado 80401</s1>
<sZ>3 aut.</sZ>
<sZ>4 aut.</sZ>
</fA14>
<fA20><s1>2097-2099</s1>
</fA20>
<fA21><s1>2004-03-22</s1>
</fA21>
<fA23 i1="01"><s0>ENG</s0>
</fA23>
<fA43 i1="01"><s1>INIST</s1>
<s2>10020</s2>
</fA43>
<fA44><s0>8100</s0>
<s1>© 2004 American Institute of Physics. All rights reserved.</s1>
</fA44>
<fA47 i1="01" i2="1"><s0>04-0132808</s0>
</fA47>
<fA60><s1>P</s1>
</fA60>
<fA61><s0>A</s0>
</fA61>
<fA64 i1="01" i2="1"><s0>Applied physics letters</s0>
</fA64>
<fA66 i1="01"><s0>USA</s0>
</fA66>
<fC01 i1="01" l="ENG"><s0>Thin films of molybdenum-doped indium oxide, an n-type transparent conducting oxide, were deposited on glass substrates by a large-area deposition technique, radio-frequency magnetron sputtering, and their electrical properties were examined. Molybdenum content was varied from 1 to 4 wt%, and the highest mobility achieved was 83 cm<sup>2</sup>
V<sup>-1</sup>
s<sup>-1</sup>
at a carrier concentration of 3.0×10<sup>20</sup>
cm<sup>-3</sup>
without any postdeposition treatment for one of the films made from the target with 2 wt% Mo. Temperature-dependent Hall analysis indicated that this high mobility is limited by phonon scattering, whereas the method of four coefficients analysis showed that the conduction band is parabolic. © 2004 American Institute of Physics.</s0>
</fC01>
<fC02 i1="01" i2="3"><s0>001B80A15A</s0>
</fC02>
<fC02 i1="02" i2="3"><s0>001B70C50G</s0>
</fC02>
<fC02 i1="03" i2="3"><s0>001B70C61L</s0>
</fC02>
<fC02 i1="04" i2="3"><s0>001B70C50J</s0>
</fC02>
<fC02 i1="05" i2="3"><s0>001B80A15C</s0>
</fC02>
<fC02 i1="06" i2="3"><s0>001B80A05H</s0>
</fC02>
<fC03 i1="01" i2="3" l="FRE"><s0>6855A</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="02" i2="3" l="FRE"><s0>7350G</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="03" i2="3" l="FRE"><s0>7361L</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="04" i2="3" l="FRE"><s0>7350J</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="05" i2="3" l="FRE"><s0>8115C</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="06" i2="3" l="FRE"><s0>8105H</s0>
<s2>PAC</s2>
<s4>INC</s4>
</fC03>
<fC03 i1="07" i2="3" l="FRE"><s0>Etude expérimentale</s0>
</fC03>
<fC03 i1="07" i2="3" l="ENG"><s0>Experimental study</s0>
</fC03>
<fC03 i1="08" i2="3" l="FRE"><s0>Indium composé</s0>
</fC03>
<fC03 i1="08" i2="3" l="ENG"><s0>Indium compounds</s0>
</fC03>
<fC03 i1="09" i2="3" l="FRE"><s0>Dépôt pulvérisation</s0>
</fC03>
<fC03 i1="09" i2="3" l="ENG"><s0>Sputter deposition</s0>
</fC03>
<fC03 i1="10" i2="3" l="FRE"><s0>Mobilité Hall</s0>
</fC03>
<fC03 i1="10" i2="3" l="ENG"><s0>Hall mobility</s0>
</fC03>
<fC03 i1="11" i2="3" l="FRE"><s0>Temps relaxation porteur charge</s0>
</fC03>
<fC03 i1="11" i2="3" l="ENG"><s0>Carrier relaxation time</s0>
</fC03>
<fC03 i1="12" i2="3" l="FRE"><s0>Couche mince semiconductrice</s0>
</fC03>
<fC03 i1="12" i2="3" l="ENG"><s0>Semiconductor thin films</s0>
</fC03>
<fC03 i1="13" i2="3" l="FRE"><s0>Molybdène</s0>
<s2>NC</s2>
</fC03>
<fC03 i1="13" i2="3" l="ENG"><s0>Molybdenum</s0>
<s2>NC</s2>
</fC03>
<fN21><s1>082</s1>
</fN21>
<fN47 i1="01" i2="1"><s0>0411M000191</s0>
</fN47>
</pA>
</standard>
</inist>
</record>
Pour manipuler ce document sous Unix (Dilib)
EXPLOR_STEP=IndiumV3/Data/Main/Repository
HfdSelect -h $EXPLOR_STEP/biblio.hfd -nk 00A676 | SxmlIndent | more
Ou
HfdSelect -h $EXPLOR_AREA/Data/Main/Repository/biblio.hfd -nk 00A676 | SxmlIndent | more
Pour mettre un lien sur cette page dans le réseau Wicri
{{Explor lien |wiki= *** parameter Area/wikiCode missing *** |area= IndiumV3 |flux= Main |étape= Repository |type= RBID |clé= Pascal:04-0132808 |texte= High-mobility, sputtered films of indium oxide doped with molybdenum }}
This area was generated with Dilib version V0.5.77. |